Log ID Log ID	Measure date Measure date	Test ID Test ID	PhotoDB tag PhotoDB tag	Options Options
344 344	2025-07-18 13:36:00 2025-07-18 13:36:00	1915 1915	UID_S4mW5hTuQp UID_S4mW5hTuQp

Log ID Log ID	Log date Log date	Part name Part name	Test type Test type	Station Station	Operator Operator	In Spec In Spec
1915 1915	2025-07-18 13:38:15 2025-07-18 13:38:15	2SFEH40R-215000043 2SFEH40R-215000043	Visual inspection Visual inspection	Reception Reception	Aloke Aloke

Glue residue on chips. Seems to be from manufacturer. In hybrid visual inspection website it is marked as good.