Log ID Log ID	Measure date Measure date	Test ID Test ID	PhotoDB tag PhotoDB tag	Options Options
345 345	2025-07-18 13:39:00 2025-07-18 13:39:00	1916 1916	UID_pn3toau50m UID_pn3toau50m

Log ID Log ID	Log date Log date	Part name Part name	Test type Test type	Station Station	Operator Operator	In Spec In Spec
1916 1916	2025-07-18 13:40:29 2025-07-18 13:40:29	2SFEH40R-215000042 2SFEH40R-215000042	Visual inspection Visual inspection	Reception Reception	Aloke Aloke

Glue residue on chips. Seems to be from manufacturer. In hybrid visual inspection website it is marked as good.