Log ID Log ID	Measure date Measure date	Test ID Test ID	PhotoDB tag PhotoDB tag	Options Options
347 347	2025-07-18 13:44:00 2025-07-18 13:44:00	1918 1918	UID_BCg5RVfYoT UID_BCg5RVfYoT

Log ID Log ID	Log date Log date	Part name Part name	Test type Test type	Station Station	Operator Operator	In Spec In Spec
1918 1918	2025-07-18 13:44:35 2025-07-18 13:44:35	2SFEH40R-215000006 2SFEH40R-215000006	Visual inspection Visual inspection	Reception Reception	Aloke Aloke

Glue residue on chips. Seems to be from manufacturer. In hybrid visual inspection website it is marked as good.